Design and Development of the Soft X-ray Ptychographic Nanoscopy Beamline at the Hefei Advanced Light Facility
Abstract
Abstract The Soft X-ray Ptychographic Nanoscopy (SoXPN) beamline, currently under construction at the Hefei Advanced Light Facility (HALF), features soft X-ray scanning spectral microscopy as its core functionality. Benefiting from the high brightness and highly coherent flux from HALF, this beamline enables ptychographic nanoimaging with an efficiency 2 orders of magnitude higher, as well as the highest spatial resolution below 3 nm. SoXPN will serve as an essential platform for comprehensive investigations of the structure, composition, chemical valence, electronic states, and magnetic properties of complex inhomogeneous systems and their dynamic processes. Herein, we present its overall design, technical evaluation protocols, and projected scientific performance. Beamline commissioning is scheduled for early 2028, with user operations expected to start in mid-2028.
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Authors: Yongqi Dong, Keran Zhu, Liang Chen, Zimeng Wang, Yajun Tong, 魏珅 Wei Shen, Xuefei Feng, Zhe Sun, Zheng Rong Jiang, Jian Wang, Zhenlin Luo
Institutions: ShanghaiTech University, University of Science and Technology of China, Canadian Light Source (Canada)