Xuefei Feng

Design and Development of the Soft X-ray Ptychographic Nanoscopy Beamline at the Hefei Advanced Light Facility

Abstract The Soft X-ray Ptychographic Nanoscopy (SoXPN) beamline, currently under construction at the Hefei Advanced Light Facility (HALF), features soft X-ray scanning spectral microscopy as its core functionality. Benefiting from the high brightness and highly coherent flux fro...