Protocol for DRIFT-EM: Direct wafer retrieval of ultrathin serial sections for volume electron microscopy

Abstract

Large-volume serial electron microscopy enables reconstructions of neural circuits at synaptic resolution but depends on reliable collection of large libraries of ultrathin sections. Here, we present a low-cost protocol for direct wafer-based section collection. We describe steps for modifying a commercial diamond knife, constructing thermoplastic barriers, mounting and tuning static ionizers for section clearing, and automated region of interest mapping of collected sections. For complete details on the use and execution of this protocol, please refer to Medina and Gogola et al. 1