Engineering & Technologyarticle2026-09-04

RGB-Sensitive TeOx/InZnO Heterojunction Phototransistor for Visible-Light-Driven Optoelectronic Synapses

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Abstract

Abstract Visible-light-responsive optoelectronic synapses are attracting increasing attention for neuromorphic vision systems because they integrate optical sensing and information processing within a single device. However, conventional oxide semiconductor phototransistors are generally limited by their wide bandgap, resulting in weak visible-light absorption and insufficient synaptic performance. Here, we demonstrate a thickness-optimized TeOx/IZO heterojunction optoelectronic synaptic phototransistor that achieves efficient visible-light sensing and neuromorphic functionality through enhanced photocarrier generation and defect-assisted carrier trapping. Systematic optimization of the TeOx layer reveals that a thickness of 5 nm provides the optimum balance between visible-light absorption, electrical switching characteristics, and carrier transport. The optimized device exhibits a low dark current of approximately 1 × 10−12 A, a high on/off current ratio of ∼108, and wavelength-dependent photoresponse enhancements of up to 2377.6% under green-light illumination compared with pristine IZO devices. Furthermore, the device successfully emulates essential synaptic functions, including excitatory postsynaptic current, short- and long-term memory, paired-pulse facilitation, and long-term potentiation/depression, while achieving a handwritten digit recognition accuracy of ∼88%. X-ray photoelectron spectroscopy, spectroscopic ellipsometry, and photo-induced current transient spectroscopy reveal that the superior photosynaptic performance originates from an optimal balance among visible-light absorption, interfacial carrier transfer, and shallow-defect-assisted carrier trapping. These results establish the TeOx/IZO heterojunction as an effective platform for oxide-based visible-light neuromorphic vision systems.

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View paper (DOI)OpenAlexACS Applied Electronic MaterialsPublished 2026-09-04

Authors: Minsu Seo, Jiseong Jang, Min Jung Kim, Yongcheol Jo, Seyoung Lee, Sooji Nam, Kwangsik Jeong, Kwun‐Bum Chung

Institutions: Yonsei University, Dongguk University, Electronics and Telecommunications Research Institute, Research Institute of Posts and Telecommunications, Institute of Electronics