Comparative analysis of parametric X-ray radiation from diamond powders with varying particle sizes

Abstract

The traditional Debye-Scherrer method for crystallite size determination faces fundamental limitations when analyzing nanosized objects due to peak broadening effects. This research explores parametric X-ray radiation (PXR) as a promising alternative approach, where radiation is excited directly from the beam of relativistic electrons passing inside a material, enabling a nanostructure characterization. We present systematic research of PXR from diamond powders across a wide particle size range (4 nm through 42 μm). Experiments conducted at the Röntgen-1 facility using a 7 MeV microtron revealed identifiable PXR reflections from the (111) and (220) crystallographic planes. The key finding demonstrates significant PXR peak broadening for nanopowders (4 nm), which exceeds the instrumental resolution by a factor of up to five at a 150° observation angle.