National Laboratory of the Rockies

Bulk degradation of P-, Sb- and As-doped Cz Si wafers and TOPCon cells due to light and elevated temperature

We assessed light- and elevated-temperature induced degradation (LeTID) in n -type Czochralski (Cz) Si wafers, and industrial tunnel oxide passivating contact (TOPCon) Si solar cells processed with and without the laser-enhanced contact optimization (LECO). A recovery pre-treatme...