Author
Zhuoran Qiao
Recent research
- Engineering & TechnologyOpen access
Copper(I) thiocyanate (CuSCN) has become one of the standard hole-transport layers (HTLs) for an ever-expanding range of device applications. However, solution-processed CuSCN films suffer from hole-trapping SCN − vacancies (V SCN ) and limited p-type conductivity. Herein, we sho...