Yongsheng Ren

Impurities and defects in Czochralski silicon: mechanisms of their effects on carrier lifetime, power conversion efficiency, and resistivity uniformity

Monocrystalline silicon grown by the Czochralski (CZ) method is the dominant material for crystalline silicon solar cells; in this material, impurities and defects directly determine wafer quality and device performance by governing three core metrics: minority carrier lifetime,...