Author

Xunwei Xu

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Recent research

  • Engineering & Technology

    Harnessing Metasurfaces for Advanced Optical Metrology

    ABSTRACT Optical metrology has played a crucial role in the advancement of science and technology. In optical metrology, the fundamental properties of light are skillfully employed as information carriers, enabling accurate measurement of numerous physical quantities. However, co...

    Laser & Photonics Review2026-08-050 citationsDOI