Xiaoyong Xie

Nonequilibrium electron-phonon energy relaxation and valley-resolved Joule heating in monolayer MoS₂ MOSFETs

Temperature rise and hotspot formation induced by self-heating severely affect the performance and reliability of two-dimensional (2D) electronic devices. Here, a first-principles-based multiscale framework combining density functional theory, TCAD simulations, and electron Monte...