Xiaoli Xi

PRISM: Feature-Guided Hierarchical Inpainting for Dual-Band Infrared Defective Pixel Clusters

This paper presents a feature-level defective pixel cluster (DPC) correction method specifically designed for dual-band infrared detectors. Due to inherent manufacturing limitations, antimonide-based type-II superlattice (T2SL) focal plane arrays (FPAs) commonly suffer from DPC i...