Thibaud Denneulin

Imaging Ionic Displacements Across Inclined Ferroelectric Domains by a Reciprocity Approach to 4D‐STEM

ABSTRACT The accurate measurement of ionic displacements in ferroelectrics by transmission electron microscopy (TEM) requires the illumination to be aligned exactly along a low‐index crystal zone axis. Adjacent domains in ferroelastic materials are often inherently inclined, hind...