Tao Xu

Achieving Ohmic and High‐Tunneling‐Probability Contacts in 2D Semiconductors via Hydrogen‐Bond‐Mediated Interfacial Coupling

ABSTRACT Developing high‐performance electronics with two‐dimensional (2D) semiconductors is often hindered by high contact resistance at metal/semiconductor interfaces, which arises from the Schottky barrier for carrier injection and tunneling barrier for carrier transport. Conv...