Srimanta Baishya

Electrical noise in NanoSheet FET in presence of interface traps: A reliability perspective in circuit application

This work investigates the reliability analysis of Interface Trap Charges (ITCs) and noise on various electrical parameters of NanoSheet FET (NSFET) using different channel materials. Simulations are carried out through 3D Sentaurus TCAD simulator under no trap, Uniform trap, and...