Souradeep Mitra

Temperature-Resolved Electrical Transport Response of ZrO x N y Thin Films under Alternating Electrical Perturbation

Abstract Cryogenic thermometry based on DC resistance measurements in polycrystalline thin films can be influenced by extrinsic grain-boundary contributions, limiting reproducibility and interchangeability. Here, we investigate zirconium oxynitride (ZrOxNy) thin films using tempe...