Seojun Yoon

A Defect-Tolerant Nano-Manufacturing Framework Toward Low-CapEx Functional Computing: Integrating Nanoimprint Lithography, Directed Self-Assembly, and Hardware–Software Co-Design

This preprint presents a cross-layer framework for defect-tolerant nanoscale computing based on NIL–DSA-enabled fabrication, 1S1R memristive crossbar arrays, and recoverability-aware system design. Rather than treating manufacturing defects solely as yield loss, the work proposes...