Sang‐Hee Ko Park

Three-DimensionalVisualization of Conductive Filamentsin TiO2 via Conductive Atomic Force Microscopy Tomography

Abstract Direct three-dimensional visualization of conductive filaments (CFs) in valence change memory is essential for resolving whether their spatial evolution is governed by stochastic defect generation or by electrode geometry. Here, we apply conductive atomic force microscop...