Rebecca Saive

Identifying Contact Barrier Types in Few-Layer MoS2 Devices Using Correlative IV, LBIC, and Bias-Dependent KPFM

Abstract Electrical contacts between metals and two-dimensional (2D) semiconductors such as molybdenum disulfide (MoS2) critically govern device performance, yet their microscopic and spatially varying contributions are difficult to disentangle with a single technique. Here we pr...

Quantifying local mechanical work at the nanoscale in optically driven piezoelectric membranes

Quantifying mechanical work generation in active micro- and nanoscale systems requires measuring both displacement and force under controlled loading conditions, yet most approaches probe these quantities separately. Here, we present an atomic force microscopy (AFM)-based method...