Kieran M. Curson

Increased cathodoluminescence signal intensity from surfaces prepared using xenon vs gallium focused ion beam

Cathodoluminescence (CL) is a powerful technique for the analysis of optoelectronic materials and devices. When used with Scanning Electron Microscopy (SEM) or Scanning Transmission Electron Microscopy (STEM), it provides bandgap and defect analysis with high spatial resolution....