Jean Felix Dushimineza

Imaging Ionic Displacements Across Inclined Ferroelectric Domains by a Reciprocity Approach to 4D‐STEM

ABSTRACT The accurate measurement of ionic displacements in ferroelectrics by transmission electron microscopy (TEM) requires the illumination to be aligned exactly along a low‐index crystal zone axis. Adjacent domains in ferroelastic materials are often inherently inclined, hind...

Disentangling surface and bulk properties of Ta3N5 photoanodes

Abstract Understanding how material and defect characteristics govern photoelectrochemical performance is essential for developing efficient and stable photoelectrodes. Although bulk properties are often emphasized, surfaces and interfaces can equally determine activity and stabi...