Hubert J. Krenner

Identifying Contact Barrier Types in Few-Layer MoS2 Devices Using Correlative IV, LBIC, and Bias-Dependent KPFM

Abstract Electrical contacts between metals and two-dimensional (2D) semiconductors such as molybdenum disulfide (MoS2) critically govern device performance, yet their microscopic and spatially varying contributions are difficult to disentangle with a single technique. Here we pr...