Hsiu‐Ying Huang

Unraveling the defect physics of SiC micropipe sidewalls by non-line-of-sight confocal spectromicroscopy: Amphoteric giant traps

Despite substantial advances in SiC crystal growth, micropipes can still occur in thick and large-diameter SiC wafers, remaining among the most detrimental extended defects associated with device failure. However, the microscopic nature of the defects residing on their internal s...