Gehan S. Rupasinghe

Contact Resistance at Interfaces Buried Within Organic Transistors Imaged Using Scanning Microwave Impedance Microscopy

Contact resistance has been a consistent challenge in the 40-year history of the organic thin-film transistor (OTFT). The problem arises because contact resistance at the metal electrode/organic interface is an amalgamation of physical phenomena: From ubiquitous defect states and...