Dennis Meier

Interferometric Vector Piezoresponse Force Microscopy for Simultaneous Ferroelectric Domain and Crystallographic Orientation Mapping in Uniaxial Ferroelectric Polycrystals

ABSTRACT Ongoing advances in scanning probe microscopy techniques are continually expanding the possibilities for nanoscale characterization and correlated studies of functional materials. Here, we demonstrate how a recent extension of piezoresponse force microscopy (PFM), known...