Byeong‐Seon An

Imaging optimization of FIB cross sections for reliable porosity analysis of PEMFC cathode catalyst layers

Abstract Focused ion beam–scanning electron microscopy (FIB–SEM) was used to investigate the effects of acceleration voltage, beam current, and cryogenic conditions on the cross-sectional preparation of proton exchange membrane fuel cell (PEMFC) cathode catalyst layers. Milling a...